Metrology and Defect Inspection in the Age of IoT
Applied Materials invites you to join us for a technical symposium followed by a reception and poster session at the Shangri-La Hotel Tokyo.
The symposium features two distinguished speakers from Toshiba Memory and FUJIFILM, as well as presentations from Applied Materials technologists who will discuss metrology and defect inspection advances in the age of IoT from multiple perspectives.
We look forward to seeing you there!
Program Details
Shangri-La Hotel Tokyo
Marunouchi Trust Tower Main
1-8-3 Marunouchi Chiyoda-ku
Tokyo, Japan
Shangri-La Ballroom
1-8-3 Marunouchi Chiyoda-ku
Tokyo, Japan
Shangri-La Ballroom
Thursday, December 13
12:30 – 13:00 Registration
13:00 – 17:20 Metrology & Inspection Technical Symposium
17:20 – 19:00 Reception and Poster Session
13:00 – 17:20 Metrology & Inspection Technical Symposium
17:20 – 19:00 Reception and Poster Session
Please register online by December 12, 2018. After this date, you may register at the event site.