2018 Applied Materials Metrology & Inspection Technical Symposium
 

Metrology and Defect Inspection in the Age of IoT

Applied Materials invites you to join us for a technical symposium followed by a reception and poster session at the Shangri-La Hotel Tokyo. 

The symposium features two distinguished speakers from Toshiba Memory and FUJIFILM, as well as presentations from Applied Materials technologists who will discuss metrology and defect inspection advances in the age of IoT from multiple perspectives.

We look forward to seeing you there!

Program Details 
Shangri-La Hotel Tokyo
Marunouchi Trust Tower Main
1-8-3 Marunouchi Chiyoda-ku
Tokyo, Japan
Shangri-La Ballroom

Thursday, December 13
12:30 – 13:00 Registration 
13:00 – 17:20 Metrology & Inspection Technical Symposium
17:20 – 19:00 Reception and Poster Session

Please register online by December 12, 2018. After this date, you may register at the event site.