| Psychometrics Meeting - Level 3 (09.00-10.30) Workshop Description
This is an interactive workshop suitable for those colleagues who have some assessment
experience, but who wish to better understand the importance of the basic
analysis of examination/assessment data. The session, facilitated by members of
the ASME Psychometric SIG, will show how to make informed judgements about the
quality of an assessment. Colleagues will find the material covered useful for
work within their own institutions, as well as for other roles such external
examiners.
The workshop will begin with an introduction to the
importance of measuring quality in assessment, and will discuss some of the
issues around item selection and design in high stakes tests (e.g. OSCEs and
SBA exams). The basics of post hoc analysis of examination data will be
explored, including a selection of overall and item level metrics. Commonly
used terminology and definitions will be explored, and illustrations will be
given of ways to report the analysis of quality at examination boards. Over the
course of the session, the benefits of the ongoing monitoring and development
of assessment material will be detailed. The workshop will conclude with a
range of suggested resources and materials to help participants in implementing
‘take home lessons’ in their own institutions.
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